TY - GEN
T1 - Modeling and simulation of BRDF of typical targets
AU - Chen, Huimin
AU - Wang, Ruibin
AU - Guo, Weirong
PY - 2011
Y1 - 2011
N2 - In order to represent the optical scattering properties of the complex surfaces, a semi-empirical model for bidirectional reflectance distribution function(BRDF) based on micro-facet theory was proposed, with which optical scattering properties of a certain kind of material are decided by parameters. In order to prove the model, the experiment system to measure the bidirectional reflectance distribution function has been designed, where a 905nm pulsed laser diode is used as the light resources, a PIN photodetector is used to measure the echo signal, and the reflection from an aluminum sample is measured. For the complex nonlinear relationship between the experiment data and modeling parameters, genetic algorithm was used to retrieve the model parameters. The results prove that calculation of the model complies with experiment data. It can be used as a reference for target feature extraction and recognition in the future.
AB - In order to represent the optical scattering properties of the complex surfaces, a semi-empirical model for bidirectional reflectance distribution function(BRDF) based on micro-facet theory was proposed, with which optical scattering properties of a certain kind of material are decided by parameters. In order to prove the model, the experiment system to measure the bidirectional reflectance distribution function has been designed, where a 905nm pulsed laser diode is used as the light resources, a PIN photodetector is used to measure the echo signal, and the reflection from an aluminum sample is measured. For the complex nonlinear relationship between the experiment data and modeling parameters, genetic algorithm was used to retrieve the model parameters. The results prove that calculation of the model complies with experiment data. It can be used as a reference for target feature extraction and recognition in the future.
KW - Bidirectional reflectance distribution function(BRDF)
KW - Four parameters semi-empirical model
KW - Genetic algorithm
UR - https://www.scopus.com/pages/publications/79959326462
U2 - 10.1109/SOPO.2011.5780516
DO - 10.1109/SOPO.2011.5780516
M3 - Conference contribution
AN - SCOPUS:79959326462
SN - 9781424465545
T3 - 2011 Symposium on Photonics and Optoelectronics, SOPO 2011
BT - 2011 Symposium on Photonics and Optoelectronics, SOPO 2011
T2 - 2011 Symposium on Photonics and Optoelectronics, SOPO 2011
Y2 - 16 May 2011 through 18 May 2011
ER -