跳到主要导航 跳到搜索 跳到主要内容

Mechanism-Informed Fault Diagnosis of Battery Thermal Runaway Using CRS-DenseNet with Risk Accumulation Features

  • Zijun Hao
  • , Ni Lin*
  • , Yongdong Gao
  • *此作品的通讯作者
  • Beijing Institute of Technology

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

The widespread transition to electric mobility has made battery safety an urgent engineering challenge. Conventional diagnostics relying on instantaneous battery management system (BMS) telemetry often overlook long-term degradation cues. To address this, we present a mechanismguided diagnostic architecture that utilizes real-world EV fleet data, pivoting to a risk accumulation paradigm rather than relying solely on real-time snapshots. By merging a populationlevel Comprehensive Risk Score (CRS) with a DenseNet neural architecture, we establish a dual-validation framework for robust feature selection and non-linear mapping. Evaluated against real-world data, the proposed model yields a flawless 100% diagnostic accuracy. Furthermore, utilizing SHapley Additive exPlanations (SHAP) for model interpretation successfully decouples feature contributions, pinpointing prolonged exposure to high state-of-charge (SOC) paired with mid-to-high C-rate charging as the primary catalysts for failure, thereby guiding targeted BMS calibration and optimization.

源语言英语
主期刊名2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
出版商Institute of Electrical and Electronics Engineers Inc.
页761-765
页数5
ISBN(电子版)9798331559076
DOI
出版状态已出版 - 2026
已对外发布是
活动2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026 - Changchun, 中国
期限: 29 5月 2026 → 31 5月 2026

丛书

姓名2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026

会议

会议2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
国家/地区中国
市Changchun
时期29/05/26 → 31/05/26

学术指纹

探究 'Mechanism-Informed Fault Diagnosis of Battery Thermal Runaway Using CRS-DenseNet with Risk Accumulation Features' 的科研主题。它们共同构成独一无二的学术指纹。

引用此