@inproceedings{039ef47a77ed4b0db574959d2123fae6,
title = "Mechanism-Informed Fault Diagnosis of Battery Thermal Runaway Using CRS-DenseNet with Risk Accumulation Features",
abstract = "The widespread transition to electric mobility has made battery safety an urgent engineering challenge. Conventional diagnostics relying on instantaneous battery management system (BMS) telemetry often overlook long-term degradation cues. To address this, we present a mechanismguided diagnostic architecture that utilizes real-world EV fleet data, pivoting to a risk accumulation paradigm rather than relying solely on real-time snapshots. By merging a populationlevel Comprehensive Risk Score (CRS) with a DenseNet neural architecture, we establish a dual-validation framework for robust feature selection and non-linear mapping. Evaluated against real-world data, the proposed model yields a flawless 100\% diagnostic accuracy. Furthermore, utilizing SHapley Additive exPlanations (SHAP) for model interpretation successfully decouples feature contributions, pinpointing prolonged exposure to high state-of-charge (SOC) paired with mid-to-high C-rate charging as the primary catalysts for failure, thereby guiding targeted BMS calibration and optimization.",
keywords = "Battery, Fault diagnosis, Risk accumulation, SHAP",
author = "Zijun Hao and Ni Lin and Yongdong Gao",
note = "Publisher Copyright: {\textcopyright} 2026 IEEE.; 2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026 ; Conference date: 29-05-2026 Through 31-05-2026",
year = "2026",
doi = "10.1109/ICETCI68937.2026.11610770",
language = "English",
series = "2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "761--765",
booktitle = "2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026",
address = "United States",
}