Low capacitance and highly reliable blind through-silicon-vias (TSVs) with vacuum-assisted spin coating of polyimide dielectric liners

Yang Yang Yan, Miao Xiong, Bin Liu, Ying Tao Ding, Zhi Ming Chen*

*此作品的通讯作者

科研成果: 期刊稿件文章同行评审

11 引用 (Scopus)

指纹

探究 'Low capacitance and highly reliable blind through-silicon-vias (TSVs) with vacuum-assisted spin coating of polyimide dielectric liners' 的科研主题。它们共同构成独一无二的指纹。

Material Science

Engineering