Interphase interface structure and evolution of a single crystal Ni-based superalloy based on HRTEM image analysis

Interface plays an important role in determining several properties in multiphase systems. It is also essential for the accurate measurement of the interface structure in a single crystal Ni-based superalloy (SCNBS) under different conditions. In this work, a subpixel accuracy transform method is introduced in detail to measure SCNBS lattice spacing at high temperatures. An intensity ratio analysis based on a high-resolution transmission electron microscopy image is employed for SCNBS interface width analysis. In this particular sample, the interface width is about 2 nm. The evolution of the lattice spacing of an ordered γ ⁰ phase and a solid solution γ matrix is also obtained at high temperatures. The lattice misfit between the matrix γ phase and the γ ⁰ precipitation increases with the temperature, with values of −0.39% and −0.21% at 20^◦C and 600^◦C. In addition, the coefficient of the SCNBS thermal expansion at high temperatures is discussed.