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Interferometry-based integrated measurement method of surface figure error and surface defects of optical components

  • Xinyu Dong
  • , Yao Hu*
  • , Qun Hao
  • , Lixin Yang
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • National Key Laboratory on Near-Surface Detection
  • China Aerospace Science and Technology Corporation

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Aiming at the lack of fast and accurate integrated measurement of surface figure error surface figure error and surface defects of optical components, this paper proposes an interferometry-based method for the integrated measurement of surface figure error and surface defects of optical components. The method first uses the traditional interferometric method to measure the surface figure error of optical components. On this basis, a new surface figure error characterization method is introduced to process the surface figure error measurement data to enhance the appearance of surface defects. Subsequently, the processed surface figure error data is output as an image, and the surface defects are identified using connected component analysis methods in the field of image processing, which in turn enables the localization and area measurement of the surface defects. The method accomplishes the measurement of surface figure error and surface defects of optical components through the same measurement system, which can realize the accurate mapping between the surface figure error and the surface defects of the measured components through the pixel coordinates, thus realizing the integrated measurement of surface figure error and surface defects of optical components. The experimental results show that the method can accomplish the integrated measurement of surface figure error and surface defects of optical components.

源语言英语
主期刊名International Conference on Advanced Imaging, Detection, and Signal Processing, AIDSP 2024
编辑Xiaofeng Zhao, Yachen Gao, Danyang Qin, Yuan Gao
出版商SPIE
ISBN(电子版)9781510693326
DOI
出版状态已出版 - 2025
已对外发布
活动2024 International Conference on Advanced Imaging, Detection, and Signal Processing, AIDSP 2024 - Harbin, 中国
期限: 27 12月 202429 12月 2024

丛书

姓名Proceedings of SPIE - The International Society for Optical Engineering
13693
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2024 International Conference on Advanced Imaging, Detection, and Signal Processing, AIDSP 2024
国家/地区中国
Harbin
时期27/12/2429/12/24

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