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Initial growth mechanism of atomic layer deposited titanium dioxide using cyclopentadienyl-type precursor: A density functional theory study

  • Guangfen Zhou
  • , Jie Ren*
  • , Shaowen Zhang
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • Hebei University of Science and Technology

科研成果: 期刊稿件文章同行评审

摘要

The initial reaction mechanism of atomic layer deposited TiO2 thin film on the silicon surface using Cp*Ti(OCH3)3 as the metal precursor has been investigated by using the density functional theory. We find that Cp*Ti(OCH3)3 adsorbed state can be formed via the hydrogen bonding interaction between CH3O ligands and the SiOH sites, which is in good agreement with the quadrupole mass spectrometry (QMS) experimental observations. Moreover, the desorption of adsorbed Cp*Ti(OCH3)3 is favored in the thermodynamic equilibrium state. The elimination reaction of CH3OH can occur more readily than that of Cp*H during the Cp*Ti(OCH 3)3 pulse. This conclusion is also confirmed by the QMS experimental results.

源语言英语
页(从-至)179-184
页数6
期刊Thin Solid Films
524
DOI
出版状态已出版 - 1 12月 2012

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