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Improving Bit-Blasting for Nonlinear Integer Constraints

  • Fuqi Jia
  • , Rui Han
  • , Pei Huang
  • , Minghao Liu
  • , Feifei Ma*
  • , Jian Zhang*
  • *此作品的通讯作者
  • University of Chinese Academy of Sciences
  • Stanford University

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Nonlinear integer constraints are common and difficult in the verification and analysis of software/hardware. SMT(QF_NIA) generalizes such constraints, which is a boolean combination of nonlinear integer arithmetic constraints. A classical method to solve SMT(QF_NIA) is bit-blasting, which reduces them to boolean satisfiability problems. Currently, the existing pure bit-blasting based solvers are noncompetitive with other state-of-the-art SMT solvers. The bit-blasting based methods have some problems: First, the bit-blasting method is hampered by nonlinear multiplication operations; second, it sometimes does not search in a proper search space; and third, it contains some redundancy. In this paper, we focus on improving the efficiency of bit-blasting based method. To decide on a proper search space, we proposed an adaptive function for hard nonlinear multiplications, and heuristic strategies to analyze specific constraints. We also found that different orders in successive additions will result in bit vectors with different bit-widths. We proposed an optimal order decision algorithm to save redundancy in successive additions. We implement a solver with the proposed methods named BLAN. Experiments demonstrate that BLAN outperforms other state-of-the-art SMT solvers (APROVE, CVC5, MATHSAT, YICES2, Z3) on the satisfiable SMT(QF_NIA) instances in SMT-LIB. We provide an outlook of BLAN on solving unsatisfiable instances via combining with other solvers. Sensitivity analysis also demonstrates the effectiveness of the proposed methods.

源语言英语
主期刊名ISSTA 2023 - Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis
编辑Rene Just, Gordon Fraser
出版商Association for Computing Machinery, Inc
页14-25
页数12
ISBN(电子版)9798400702211
DOI
出版状态已出版 - 12 7月 2023
已对外发布是
活动32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023 - Seattle, 美国
期限: 17 7月 2023 → 21 7月 2023

丛书

姓名ISSTA 2023 - Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis

会议

会议32nd ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 2023
国家/地区美国
市Seattle
时期17/07/23 → 21/07/23

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