High-temperature dielectric response and multiscale mechanism of SiO ₂/Si₃N₄ nanocomposites

The high-temperature dielectric properties of SiO₂/Si ₃N₄ nanocomposites are investigated theoretically and experimentally. Its permittivities and loss tangents at the temperature ranging from room temperature to 1300°C at 9.0 GHz are measured by the resonant cavity method. The SiO₂/Si₃N₄ nanocomposites show complex dielectric behaviour at elevated temperature, and a multi-scale model is proposed to describe the dependence of the dielectric properties in the SiO₂/Si₃N₄ on its compositional variations. Such a theory is needed so that the available property measurements could be extrapolated to other operating frequencies and temperatures.