Heat Generation Measurement of MOSFET in High-Frequency Transformer Circuits

With the miniaturization of semiconductor devices, heat generation management for Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) is of vital importance. High-frequency switching of MOSFETs is a key component in the operation of transformer circuits. Thus, gaining a deeper understanding of MOSFET heat generation under these high-frequency operating conditions is essential. In this study, we present a transformer circuit based on Pulsed Width Modulation (PWM) regulation and provide a reliable method to measure the temperature variation of MOSFET. We found that higher working frequency usually leads to a higher heat accumulation and thus a higher temperature change.