TY - GEN
T1 - FOFL
T2 - 2025 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2025
AU - Sun, Qingyuan
AU - Peng, Tu
AU - Yang, Yating
AU - Song, Tian
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - Learning-based fault localization has become a prominent research direction in software engineering due to its ability to leverage diverse program artifacts such as execution traces and coverage data for precise fault identification. However, current techniques face two fundamental limitations: (1) oversimplified representations of program behavior through basic coverage metrics, and (2) high computational cost associated with collecting fine-grained runtime data. In this work, we present FOFL, a novel function output-based fault localization approach. Our intuition is that programs can be modeled as complex dynamical systems, where faults manifest as perturbations observable through function outputs. Our method first captures function-level output patterns during execution, then encodes them into a structured matrix representation that preserves system-level behavioral signatures. These matrices are analyzed through a hybrid deep learning architecture combining convolutional neural networks for spatial feature extraction and attention mechanisms for critical pattern recognition, ultimately producing a ranked list of suspicious locations. Experiments on the widely used Defects4J benchmark show that FOFL outperforms existing techniques by localizing 204 bugs in the Top-1 ranking, which corresponds to a 25-bug improvement over state-of-the-art methods, while also enhancing MFR and MAR by 4.5% and 4.3%, respectively. Furthermore, ablation studies confirm the positive contribution of listwise loss function and feature aggregation design. The results establish FOFL as an effective solution that advances fault localization through principled system modeling and targeted learning of informative data representations.
AB - Learning-based fault localization has become a prominent research direction in software engineering due to its ability to leverage diverse program artifacts such as execution traces and coverage data for precise fault identification. However, current techniques face two fundamental limitations: (1) oversimplified representations of program behavior through basic coverage metrics, and (2) high computational cost associated with collecting fine-grained runtime data. In this work, we present FOFL, a novel function output-based fault localization approach. Our intuition is that programs can be modeled as complex dynamical systems, where faults manifest as perturbations observable through function outputs. Our method first captures function-level output patterns during execution, then encodes them into a structured matrix representation that preserves system-level behavioral signatures. These matrices are analyzed through a hybrid deep learning architecture combining convolutional neural networks for spatial feature extraction and attention mechanisms for critical pattern recognition, ultimately producing a ranked list of suspicious locations. Experiments on the widely used Defects4J benchmark show that FOFL outperforms existing techniques by localizing 204 bugs in the Top-1 ranking, which corresponds to a 25-bug improvement over state-of-the-art methods, while also enhancing MFR and MAR by 4.5% and 4.3%, respectively. Furthermore, ablation studies confirm the positive contribution of listwise loss function and feature aggregation design. The results establish FOFL as an effective solution that advances fault localization through principled system modeling and targeted learning of informative data representations.
UR - https://www.scopus.com/pages/publications/105033146705
U2 - 10.1109/SMC58881.2025.11343452
DO - 10.1109/SMC58881.2025.11343452
M3 - Conference contribution
AN - SCOPUS:105033146705
T3 - Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
SP - 5393
EP - 5398
BT - 2025 IEEE International Conference on Systems, Man, and Cybernetics
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 5 October 2025 through 8 October 2025
ER -