TY - GEN
T1 - Fault diagnosis of flying control system servo actuator based on Elman neural network
AU - Zhang, Guopeng
AU - Wang, Bo
PY - 2011
Y1 - 2011
N2 - Servo actuator is one most important section of flying control system, and faults also often happen to it. The fault detection and diagnosis technology is seriously important to improve the reliability of servo actuator. The paper proposes a method of fault diagnosis based on Elman neural network, using its non-linear distributed processing and dynamic feature reflecting ability to detect servo actuator fault. Then, neural network algorithm is applied to simulation. The result indicated that the method could accurately identify the servo actuator fault. Meanwhile, compared with BP neural network, the advantage of Elman neural network in fault diagnosis is confirmed.
AB - Servo actuator is one most important section of flying control system, and faults also often happen to it. The fault detection and diagnosis technology is seriously important to improve the reliability of servo actuator. The paper proposes a method of fault diagnosis based on Elman neural network, using its non-linear distributed processing and dynamic feature reflecting ability to detect servo actuator fault. Then, neural network algorithm is applied to simulation. The result indicated that the method could accurately identify the servo actuator fault. Meanwhile, compared with BP neural network, the advantage of Elman neural network in fault diagnosis is confirmed.
KW - BP neural network
KW - elman neural network
KW - fault diagnosis
KW - servo actuator
UR - https://www.scopus.com/pages/publications/80054964361
U2 - 10.1109/ICEMI.2011.6037944
DO - 10.1109/ICEMI.2011.6037944
M3 - Conference contribution
AN - SCOPUS:80054964361
SN - 9781424481590
T3 - Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
SP - 46
EP - 49
BT - Proceedings - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
T2 - IEEE 2011 10th International Conference on Electronic Measurement and Instruments, ICEMI 2011
Y2 - 16 August 2011 through 18 August 2011
ER -