摘要
Photon-counting polarimetric imaging provides more dimensional information compared to conventional imaging systems. We present a compact dual-wavelength infrared polarimetric light detection and ranging system operating at 1550 and 2004 nm, utilizing direct detection with superconducting nanowire single-photon detectors. This system achieves millimeter-scale resolution in both lateral and axial dimensions at a target distance of ∼1.3 m. Experimental results demonstrate an improved material discrimination advantage at low photon flux by integrating dual-band photon counting detection with polarimetric imaging, outperforming traditional intensity-based measurement methods. This work demonstrates broad application prospects in scenarios involving mid-infrared remote sensing and complex environmental exploration.
| 源语言 | 英语 |
|---|---|
| 期刊论文编号 | 011102 |
| 期刊 | Chinese Optics Letters |
| 卷 | 24 |
| 期 | 1 |
| DOI | |
| 出版状态 | 已出版 - 1 1月 2026 |
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