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Excitation to defect-bound band edge states in two-dimensional semiconductors and its effect on carrier transport

  • Dan Wang
  • , Dong Han
  • , Damien West
  • , Nian Ke Chen
  • , Sheng Yi Xie
  • , Wei Quan Tian
  • , Vincent Meunier
  • , Shengbai Zhang
  • , Xian Bin Li*
  • *此作品的通讯作者
  • Jilin University
  • CAS - Changchun Institute of Optics Fine Mechanics and Physics
  • Rensselaer Polytechnic Institute
  • Chongqing University

科研成果: 期刊稿件文章同行评审

摘要

The ionization of dopants is a crucial process for electronics, yet it can be unexpectedly difficult in two-dimensional materials due to reduced screening and dimensionality. Using first-principles calculations, here we propose a dopant ionization process for two-dimensional semiconductors where charge carriers are only excited to a set of defect-bound band edge states, rather than to the true band edge states, as is the case in three-dimensions. These defect-bound states have small enough ionization energies but large enough spatial delocalization. With a modest defect density, carriers can transport through band by such states.

源语言英语
期刊论文编号8
期刊npj Computational Materials
5
1
DOI
出版状态已出版 - 1 12月 2019
已对外发布

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