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Evidence of two-length-scale kinetics of R-phase transformation by high-energy X-ray diffraction

  • Y. D. Wang*
  • , Y. Ren
  • , E. W. Huang
  • , G. Wang
  • , Z. H. Nie
  • , L. Zuo
  • , P. K. Liaw
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • Argonne National Laboratory
  • University of Tennessee, Knoxville
  • Northeastern University China

科研成果: 期刊稿件文章同行评审

摘要

The cubic-to-rhombohedral (C-R) phase transition in an AuCd shape memory alloy was investigated by in situ high-energy X-ray diffraction. We present the first direct experimental evidence of two-length-scale phase transition kinetics in this alloy system. It was further found that aging in the R-phase leads to two-way memory "loss", characterized by the reselection of new variants. We attributed this two-way memory "loss" to the internal stresses caused by the defects formed in the off-equilibrium state of the studied AuCd system.

源语言英语
页(从-至)617-620
页数4
期刊Scripta Materialia
62
8
DOI
出版状态已出版 - 4月 2010

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