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Effect of temperature on microstructural stabilization and mechanical properties in the dynamic testing of nanocrystalline pure Ti

  • Shixiong Zhang
  • , Ying Chun Wang*
  • , Alexander P. Zhilyaev
  • , Dmitry V. Gunderov
  • , Shukui Li
  • , Georgy I. Raab
  • , Elena Korznikova
  • , Terence G. Langdon
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • Russian Academy of Sciences
  • Peter the Great St. Petersburg Polytechnic University
  • Ufa University of Science and Technology
  • University of Southampton

科研成果: 期刊稿件文章同行评审

摘要

Commercial purity (CP) Ti was processed by a two-step procedure of ECAP and drawing to give a nanocrystalline (NC) grain size of ~90nm. Samples were tested in compression at a strain rate of 10s-1 over the temperature range of 298-673K. The results show the high stored energy and high interface energy promote the process of static recrystallization (SRX) when the NC Ti is heated above 573K. Migration dynamic recrystallization (m-DRX) operates during compressive deformation at temperatures of 298-573K giving a homogeneous microstructure. The compressive yield strength and peak stress at 298K were measured as 1230 and 1330MPa, respectively. When the test temperature is increased from 298 to 673K, the yield strength and peak stress decrease and the work hardening rate and dynamic softening rate are also reduced.

源语言英语
页(从-至)64-70
页数7
期刊Materials Science and Engineering: A
634
DOI
出版状态已出版 - 4 5月 2015

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