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Edge detection of optical subaperture image based on improved differential box-counting method

  • Beijing Institute of Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Optical synthetic aperture imaging technology is an effective approach to improve imaging resolution. Compared with monolithic mirror system, the image of optical synthetic aperture system is often more complex at the edge, and as a result of the existence of gap between segments, which makes stitching becomes a difficult problem. So it is necessary to extract the edge of subaperture image for achieving effective stitching. Fractal dimension as a measure feature can describe image surface texture characteristics, which provides a new approach for edge detection. In our research, an improved differential box-counting method is used to calculate fractal dimension of image, then the obtained fractal dimension is mapped to grayscale image to detect edges. Compared with original differential box-counting method, this method has two improvements as follows: by modifying the box-counting mechanism, a box with a fixed height is replaced by a box with adaptive height, which solves the problem of over-counting the number of boxes covering image intensity surface; an image reconstruction method based on super-resolution convolutional neural network is used to enlarge small size image, which can solve the problem that fractal dimension can't be calculated accurately under the small size image, and this method may well maintain scale invariability of fractal dimension. The experimental results show that the proposed algorithm can effectively eliminate noise and has a lower false detection rate compared with the traditional edge detection algorithms. In addition, this algorithm can maintain the integrity and continuity of image edge in the case of retaining important edge information.

源语言英语
主期刊名2017 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Imaging/Spectroscopy and Signal Processing Technology
编辑Guohai Situ, Wolfgang Osten, Xun Cao
出版商SPIE
ISBN(电子版)9781510617513
DOI
出版状态已出版 - 2018
活动2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, OIT 2017 - Beijing, 中国
期限: 28 10月 201730 10月 2017

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10620
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, OIT 2017
国家/地区中国
Beijing
时期28/10/1730/10/17

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