摘要
Side-channel analysis poses a significant security threat to cryptographic chips in embedded devices. The use of deep learning in side-channel analysis makes it easier to compromise the security of cryptographic chips. Although these chips equipped with countermeasures can increase the complexity of side-channel analysis, it is essential to continue exploring and developing more advanced analysis methods for better security. In this brief, we propose a simple residual network called ResNet-S, which has shown strong performance. Based on this foundation, we have developed the dual-path hybrid residual network. The dual-path hybrid convolution technique is used for feature fusion. It utilizes a multi-scale convolution strategy to effectively reduces the required number of traces for key recovery. We have evaluated the performance of our proposed neural networks on different datasets, and the experimental results show that our proposed networks outperform the state-of-the-art neural networks that have been published.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 3985-3989 |
| 页数 | 5 |
| 期刊 | IEEE Transactions on Circuits and Systems II: Express Briefs |
| 卷 | 71 |
| 期 | 8 |
| DOI | |
| 出版状态 | 已出版 - 2024 |
指纹
探究 'Dual-Path Hybrid Residual Network for Profiled Side-Channel Analysis' 的科研主题。它们共同构成独一无二的指纹。引用此
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