摘要
We have studied down-conversion photoluminescence (PL) from (Ce, Yb) co-doped "oxygen rich" silicon oxide films prepared by sputtering and annealing. The Ce3+ ∼510 nm PL is sensitive to the Ce concentration of the films and is much stronger for 3 at. % Ce than for 2 at. % Ce after annealing at 1200 °C. The PL emission and excitation spectroscopy results indicate that the excitation of Yb3+ is mainly through an energy transfer from Ce3+ to Yb3+, oxide defects also play a role in the excitation of Yb3+ after lower temperature (∼800 °C) annealing. The Ce3+ 510 nm photon excites mostly only one Yb3+ 980 nm photon. Temperature-dependent PL measurements suggest that the energy transfer from Ce3+ to Yb3+ is partly thermally activated.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 123105 |
| 期刊 | Journal of Applied Physics |
| 卷 | 119 |
| 期 | 12 |
| DOI | |
| 出版状态 | 已出版 - 28 3月 2016 |
| 已对外发布 | 是 |
指纹
探究 'Down-conversion luminescence from (Ce, Yb) co-doped oxygen-rich silicon oxides' 的科研主题。它们共同构成独一无二的指纹。引用此
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