Development of high sensitivity diffraction enhanced imaging at BSRF

Background: As an important phase contrast imaging method, diffraction enhanced imaging (DEI) utilizes crystal's angular selectivity to detect the X-ray's angular change caused by the sample, resulting in sample's phase image. Crystal rocking curve is the main feature of DEI setup, and its width decreases when the crystal index of diffraction plane used in the setup increases, resulting in the increased imaging sensitivity. Purpose: At the 4W1A X-ray imaging beam line of Beijing synchrotron radiation facility (BSRF), DEI experiments are generally carried out with Si(111) crystal. This study aims to construct a high-index crystal DEI setup to improve imaging sensitivity. Methods: Based on theoretical analysis, special mechanical design and crystal processing, a new high sensitive DEI setup was developed using Si(400) and Si(333) crystals. The performance of the setup was tested and experiments using standard sample and real biological sample were carried out to verify the usability of the setup. Results: Performance testing results and experimental results show that higher imaging sensitivity can be obtained using the new DEI setup. Conclusion: The high sensitivity DEI setup at BSRF using Si(400) and Si(333) crystals was successfully developed, and this setup can give higher imaging sensitivity to 2D and 3D imaging experiment.