@inproceedings{22ca73d63e634aa083e18377e898cab7,
title = "Development of high accuracy in-situ measurement system for spectral reflectance of thermal control coatings",
abstract = "In order to meet the experimental requirement of in-situ measurement for spectral reflectance of advanced thermal control coatings, a high accuracy in-situ measurement system for spectral reflectance of thermal control coatings of spacecraft is developed based on dual-beam spectrophotometry. The measurement wavelength range is 200 to 2500 nm, and the measurement accuracy is better than 0.5\%. In the space ultraviolet radiation environmental effect test, it can realize the integrated test process of sample delivery, sampling, separation, in-situ measurement of spectral reflectance in vacuum.",
keywords = "In-situ measurement, Measurement system, Spectral reflectance, Thermal control coatings, Vacuum cryogenic environment",
author = "Pengsong Zhang and Bolun Zhang and Danyi Wang and Shanping Jiang and Wei Leng and Hongsong Li and Linhua Yang",
note = "Publisher Copyright: {\textcopyright} 2018 SPIE.; Optical Metrology and Inspection for Industrial Applications V 2018 ; Conference date: 11-10-2018 Through 13-10-2018",
year = "2018",
doi = "10.1117/12.2503691",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Toru Yoshizawa and Song Zhang and Sen Han and Sen Han",
booktitle = "Optical Metrology and Inspection for Industrial Applications V",
address = "United States",
}