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Design of the new rigid endoscope distortion measurement system

  • Xiaohao Zhai
  • , Xiaohua Liu*
  • , Ming Liu
  • , Mei Hui
  • , Liquan Dong
  • , Yuejin Zhao
  • , Yakun Wang
  • , Yonghui Li
  • , Peng Zhou
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • Beijing Medical Equipment Testing Institution
  • Capital Medical University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Endoscopic imaging quality affects industrial safety and medical security. Rigid endoscope distortion is of great signification as one of optical parameters to evaluate the imaging quality. This paper introduces a new method of rigid endoscope distortion measurement, which is different from the common methods with low accuracy and fussy operation. It contains a Liquid Crystal Display (LCD) to display the target, a CCD to obtain the images with distortion, and a computer to process the images. The LCD is employed instead of common white screen. The autonomous control system of LCD makes it showing the test target designed for distortion, and its parameter is known. LCD control system can change the test target to satisfy the different demand for accuracy, which avoids replacing target frequently. The test system also contains a CCD to acquire images in the exit pupil position of rigid endoscope. Rigid endoscope distortion is regarded as centrosymmetric, and the MATLAB software automatically measures it by processing the images from CCD. The MATLAB software compares target images with that without distortion on LCD and calculates the results. Relative distortion is obtained at different field of view (FOV) radius. The computer plots the curve of relative distortion, abscissa means radius of FOV, ordinate means relative distortion. The industry standard shows that, the distortion at 70% field of view is pointed on the curve, which can be taken as an evaluation standard. This new measuring method achieves advantages of high precision, high degree of intelligence, excellent repeatability and gets calculation results quickly.

源语言英语
主期刊名2015 International Conference on Optical Instruments and Technology
主期刊副标题Optoelectronic Measurement Technology and Systems, OIT 2015
编辑Kexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam, Sen Han
出版商SPIE
ISBN(电子版)9781628418040
DOI
出版状态已出版 - 2015
活动2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015 - Beijing, 中国
期限: 17 5月 201519 5月 2015

丛书

姓名Proceedings of SPIE - The International Society for Optical Engineering
9623
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015
国家/地区中国
Beijing
时期17/05/1519/05/15

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