Component distribution of nano-carbon materials assisted by time of flight-secondary ion mass spectrometer

Ying Dong; Fan Xu; Yan Li; Tinglu Song; Guoqiang Tan

doi:10.1088/1742-6596/2011/1/012071

Component distribution of nano-carbon materials assisted by time of flight-secondary ion mass spectrometer

Ying Dong
, Fan Xu
, Yan Li
, Tinglu Song^*
, Guoqiang Tan^*

^*此作品的通讯作者

材料学院

科研成果: 期刊稿件 › 会议文章 › 同行评审

5 引用（Scopus）

摘要

Currently, there exist various materials surface analysis and characterization techniques, but it is difficult to measure their component distribution, in particular from a three-dimensional prospect. In this paper, the component distribution of nano-carbon materials in 2D and 3D views were both characterized via Time of Flight-Secondary Ion Mass Spectrometer (TOF-SIMS). The results indicate that TOF-SIMS could provide comprehensive information about component distribution, which is expected to be developed as an advanced technology in material analysis and characterization to the research community.

源语言	英语
文章编号	012071
期刊	Journal of Physics: Conference Series
卷	2011
期	1
DOI	https://doi.org/10.1088/1742-6596/2011/1/012071
出版状态	已出版 - 8 9月 2021
活动	2021 5th International Conference on Green Composite Materials and Nanotechnology, GCMN 2021 - Nanjing, Virtual, 中国期限: 23 7月 2021 → 25 7月 2021

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title = "Component distribution of nano-carbon materials assisted by time of flight-secondary ion mass spectrometer",

abstract = "Currently, there exist various materials surface analysis and characterization techniques, but it is difficult to measure their component distribution, in particular from a three-dimensional prospect. In this paper, the component distribution of nano-carbon materials in 2D and 3D views were both characterized via Time of Flight-Secondary Ion Mass Spectrometer (TOF-SIMS). The results indicate that TOF-SIMS could provide comprehensive information about component distribution, which is expected to be developed as an advanced technology in material analysis and characterization to the research community.",

author = "Ying Dong and Fan Xu and Yan Li and Tinglu Song and Guoqiang Tan",

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AU - Dong, Ying

AU - Xu, Fan

AU - Li, Yan

AU - Song, Tinglu

AU - Tan, Guoqiang

PY - 2021/9/8

Y1 - 2021/9/8

N2 - Currently, there exist various materials surface analysis and characterization techniques, but it is difficult to measure their component distribution, in particular from a three-dimensional prospect. In this paper, the component distribution of nano-carbon materials in 2D and 3D views were both characterized via Time of Flight-Secondary Ion Mass Spectrometer (TOF-SIMS). The results indicate that TOF-SIMS could provide comprehensive information about component distribution, which is expected to be developed as an advanced technology in material analysis and characterization to the research community.

AB - Currently, there exist various materials surface analysis and characterization techniques, but it is difficult to measure their component distribution, in particular from a three-dimensional prospect. In this paper, the component distribution of nano-carbon materials in 2D and 3D views were both characterized via Time of Flight-Secondary Ion Mass Spectrometer (TOF-SIMS). The results indicate that TOF-SIMS could provide comprehensive information about component distribution, which is expected to be developed as an advanced technology in material analysis and characterization to the research community.

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DO - 10.1088/1742-6596/2011/1/012071

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VL - 2011

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

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T2 - 2021 5th International Conference on Green Composite Materials and Nanotechnology, GCMN 2021

Y2 - 23 July 2021 through 25 July 2021

ER -

Component distribution of nano-carbon materials assisted by time of flight-secondary ion mass spectrometer

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