Component distribution of nano-carbon materials assisted by time of flight-secondary ion mass spectrometer

Ying Dong, Fan Xu, Yan Li, Tinglu Song*, Guoqiang Tan*

*此作品的通讯作者

科研成果: 期刊稿件会议文章同行评审

4 引用 (Scopus)

摘要

Currently, there exist various materials surface analysis and characterization techniques, but it is difficult to measure their component distribution, in particular from a three-dimensional prospect. In this paper, the component distribution of nano-carbon materials in 2D and 3D views were both characterized via Time of Flight-Secondary Ion Mass Spectrometer (TOF-SIMS). The results indicate that TOF-SIMS could provide comprehensive information about component distribution, which is expected to be developed as an advanced technology in material analysis and characterization to the research community.

源语言英语
文章编号012071
期刊Journal of Physics: Conference Series
2011
1
DOI
出版状态已出版 - 8 9月 2021
活动2021 5th International Conference on Green Composite Materials and Nanotechnology, GCMN 2021 - Nanjing, Virtual, 中国
期限: 23 7月 202125 7月 2021

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