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Characterization of Electronic Transients by an Ultrafast Scanning Tunneling Microscope

  • Tian Lan*
  • , Guo Qiang Ni
  • *此作品的通讯作者
  • Beijing Institute of Technology

科研成果: 期刊稿件文章同行评审

摘要

In this paper, we report experimental results of picosecond electrical transients pumped by ultrashort laser pulses on a coplanar strip line with an ultrafast scanning tunneling microscope. The resolved transient signal has a rise time in non-contact mode of 1.21 ps and the FWHM is 1.19 ps. Our measurements showed that the amplitude and the shape of the transient signals are independent of the magnitude and the polarity of the dc tunneling current, which confirms the capacitive coupling of the transient signal between the tip and the coplanar transmission line.

源语言英语
页(从-至)617-620
页数4
期刊International Journal of Nonlinear Sciences and Numerical Simulation
3
3-4
DOI
出版状态已出版 - 2002

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