Carrier density and compensation in semiconductors with multi dopants and multi transition energy levels: The case of Cu impurity in CdTe

Su Huai Wei*, Jie Ma, T. A. Gessert, Ken K. Chin

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

2 引用 (Scopus)

指纹

探究 'Carrier density and compensation in semiconductors with multi dopants and multi transition energy levels: The case of Cu impurity in CdTe' 的科研主题。它们共同构成独一无二的指纹。

Material Science