Calibration of misalignment errors in the non-null interferometry based on reverse iteration optimization algorithm

Xinmu Zhang, Qun Hao, Yao Hu*, Shaopu Wang, Yan Ning, Tengfei Li, Shufen Chen

*此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

With no necessity of compensating the whole aberration introduced by the aspheric surfaces, non-null test has the advantage over null test in applicability. However, retrace error, which is brought by the path difference between the rays reflected from the surface under test (SUT) and the incident rays, is introduced into the measurement and makes up of the residual wavefront aberrations (RWAs) along with surface figure error (SFE), misalignment error and other influences. Being difficult to separate from RWAs, the misalignment error may remain after measurement and it is hard to identify whether it is removed or not. It is a primary task to study the removal of misalignment error. A brief demonstration of digital Moiré interferometric technique is presented and a calibration method for misalignment error on the basis of reverse iteration optimization (RIO) algorithm in non-null test method is addressed. The proposed method operates mostly in the virtual system, and requires no accurate adjustment in the real interferometer, which is of significant advantage in reducing the errors brought by repeating complicated manual adjustment, furthermore improving the accuracy of the aspheric surface test. Simulation verification is done in this paper. The calibration accuracy of the position and attitude can achieve at least a magnitude of 10-5 mm and 0.0056×10-6rad, respectively. The simulation demonstrates that the influence of misalignment error can be precisely calculated and removed after calibration.

源语言英语
主期刊名AOPC 2017
主期刊副标题3D Measurement Technology for Intelligent Manufacturing
编辑Anand Krishna Asundi, Huijie Zhao, Wolfgang Osten
出版商SPIE
ISBN(电子版)9781510613973
DOI
出版状态已出版 - 2017
活动Applied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017 - Beijing, 中国
期限: 4 6月 20176 6月 2017

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
10458
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议Applied Optics and Photonics China: 3D Measurement Technology for Intelligent Manufacturing, AOPC 2017
国家/地区中国
Beijing
时期4/06/176/06/17

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