Build-in-self-test of a real time digital signal processing system

Haipeng Yuan; Teng Long; Yansheng Yue

doi:10.1109/ICR.2001.984875

Build-in-self-test of a real time digital signal processing system

Haipeng Yuan
, Teng Long^*
, Yansheng Yue

^*此作品的通讯作者

信息与电子学院

Beijing Institute of Technology

科研成果: 会议稿件 › 论文 › 同行评审

1 引用（Scopus）

摘要

A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing, could integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered, and the performance of the time domain processing test and frequency domain processing test are analysed.

源语言	英语
页	983-986
页数	4
DOI	https://doi.org/10.1109/ICR.2001.984875
出版状态	已出版 - 2001
活动	2001 CIE International Conference on Radar, RADAR 2001 - Beijing, 中国期限: 15 10月 2001 → 18 10月 2001

会议

会议	2001 CIE International Conference on Radar, RADAR 2001
国家/地区	中国
市	Beijing
时期	15/10/01 → 18/10/01

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10.1109/ICR.2001.984875

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引用此

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title = "Build-in-self-test of a real time digital signal processing system",

abstract = "A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing, could integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered, and the performance of the time domain processing test and frequency domain processing test are analysed.",

keywords = "Built-in self-test, Digital signal processor, Testable design",

author = "Haipeng Yuan and Teng Long and Yansheng Yue",

year = "2001",

doi = "10.1109/ICR.2001.984875",

language = "English",

pages = "983--986",

note = "2001 CIE International Conference on Radar, RADAR 2001 ; Conference date: 15-10-2001 Through 18-10-2001",

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TY - CONF

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AU - Yuan, Haipeng

AU - Long, Teng

AU - Yue, Yansheng

PY - 2001

Y1 - 2001

N2 - A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing, could integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered, and the performance of the time domain processing test and frequency domain processing test are analysed.

AB - A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing, could integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered, and the performance of the time domain processing test and frequency domain processing test are analysed.

KW - Built-in self-test

KW - Digital signal processor

KW - Testable design

UR - https://www.scopus.com/pages/publications/0035719615

U2 - 10.1109/ICR.2001.984875

DO - 10.1109/ICR.2001.984875

M3 - Paper

AN - SCOPUS:0035719615

SP - 983

EP - 986

T2 - 2001 CIE International Conference on Radar, RADAR 2001

Y2 - 15 October 2001 through 18 October 2001

ER -

Build-in-self-test of a real time digital signal processing system

摘要

会议

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学术指纹

引用此