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Atomically sharp interface enabled ultrahigh-speed non-volatile memory devices

  • Liangmei Wu
  • , Aiwei Wang
  • , Jinan Shi
  • , Jiahao Yan
  • , Zhang Zhou
  • , Ce Bian
  • , Jiajun Ma
  • , Ruisong Ma
  • , Hongtao Liu
  • , Jiancui Chen
  • , Yuan Huang
  • , Wu Zhou
  • , Lihong Bao*
  • , Min Ouyang*
  • , Stephen J. Pennycook
  • , Sokrates T. Pantelides
  • , Hong Jun Gao*
  • *此作品的通讯作者
  • CAS - Institute of Physics
  • University of Chinese Academy of Sciences
  • Chinese Academy of Sciences
  • Songshan Lake Materials Laboratory
  • University of Maryland, College Park
  • National University of Singapore
  • Vanderbilt University

科研成果: 期刊稿件文章同行评审

摘要

The development of high-performance memory devices has played a key role in the innovation of modern electronics. Non-volatile memory devices have manifested high capacity and mechanical reliability as a mainstream technology; however, their performance has been hampered by low extinction ratio and slow operational speed. Despite substantial efforts to improve these characteristics, typical write times of hundreds of micro- or milliseconds remain a few orders of magnitude longer than that of their volatile counterparts. Here we demonstrate non-volatile, floating-gate memory devices based on van der Waals heterostructures with atomically sharp interfaces between different functional elements, achieving ultrahigh-speed programming/erasing operations in the range of nanoseconds with extinction ratio up to 1010. This enhanced performance enables new device capabilities such as multi-bit storage, thus opening up applications in the realm of modern nanoelectronics and offering future fabrication guidelines for device scale up.

源语言英语
页(从-至)882-887
页数6
期刊Nature Nanotechnology
16
8
DOI
出版状态已出版 - 8月 2021
已对外发布

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