Applications of wavefront modulation devices in aspheric and freeform measurement

Qun Hao, Yan Ning, Yao Hu

科研成果: 书/报告/会议事项章节会议稿件同行评审

3 引用 (Scopus)

摘要

Wavefront modulation devices are of great significance in optical information processing systems. These devices capable of phase modulation are used in a variety of optical applications: wavefront correction, optical metrology, adaptive optics, aberration compensation, etc. The liquid crystal spatial light modulators (LC-SLMs) and deformable mirrors (DMs) have been regarded as the promising device for their flexibility and programmability on wavefront modulations. This paper presents applications of LC-SLMs and DMs when they are used as aberration compensators in testing of aspheric and freeform. Besides, a pixel-wise method based on analysis of the phase maps obtained by a Fizeau interferometer for calibrating the phase modulation characteristics of the LC-SLM is proposed. A PLUTO-VIS-020 LC-SLM produced by the Holoeye Company is employed in the calibrating experiment. A Zygo interferometer based on Fizeau interference theory is also employed. The experimental results demonstrate that the phase modulation characteristics of LC-SLM and a specific lookup table (LUT) for every pixel of the LC-SLM aperture can be obtained by utilizing the proposed method with convenience and high efficiency. The device calibrated in this paper provides a high phase shift up to 6π at 632.8nm wavelength and has a linearized phase distribution. It coincides well with the average modulation curve offered in the manual of the device. This paper provides a simple and accurate method for pixel-wise phase modulation characteristics calibration.

源语言英语
主期刊名Tenth International Symposium on Precision Engineering Measurements and Instrumentation
编辑Jie Lin, Jiubin Tan
出版商SPIE
ISBN(电子版)9781510627819
DOI
出版状态已出版 - 2019
活动10th International Symposium on Precision Engineering Measurements and Instrumentation, ISPEMI 2018 - Kunming, 中国
期限: 8 8月 201810 8月 2018

出版系列

姓名Proceedings of SPIE - The International Society for Optical Engineering
11053
ISSN(印刷版)0277-786X
ISSN(电子版)1996-756X

会议

会议10th International Symposium on Precision Engineering Measurements and Instrumentation, ISPEMI 2018
国家/地区中国
Kunming
时期8/08/1810/08/18

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