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Application of guard traces with vias in the RF PCB layout

  • Tsinghua University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

In this paper we discuss the affection of the guard traces(shown in Figure 3) with vias to the function of the parallel double micro-strip lines in the PCB layout, the structure of the parallel double micro-strip line is treated as a symmetrical network with 4 ports, simulation on the S parameters is processed, from the S parameters we can analyze the effect of the guard trace, then get the conclusion that the guard trace with vias is helpful to decrease the coupling strength between the double micro-strip lines.

源语言英语
主期刊名2002 3rd International Symposium on Electromagnetic CompatibiIity, EMC 2002
编辑Yinghong Wen, Linchang Zhang
出版商Institute of Electrical and Electronics Engineers Inc.
771-774
页数4
ISBN(电子版)0780372778
DOI
出版状态已出版 - 2002
已对外发布
活动3rd International Symposium on Electromagnetic CompatibiIity, EMC 2002 - Beijing, 中国
期限: 21 5月 200224 5月 2002

出版系列

姓名IEEE International Symposium on Electromagnetic Compatibility
2002-January
ISSN(印刷版)1077-4076
ISSN(电子版)2158-1118

会议

会议3rd International Symposium on Electromagnetic CompatibiIity, EMC 2002
国家/地区中国
Beijing
时期21/05/0224/05/02

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