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Application of Conformal Optical Design in Star Sensor 66240S

  • Yan Li*
  • , Lin Li
  • , Yifan Huang
  • , Jiaguo Liu
  • *此作品的通讯作者
  • Beijing Institute of Technology

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Star sensor is a special high accuracy photoelectric instrument. It is often used in navigation of aircraft, cruise missiles, and ballistic missiles, so the imaging quality of the optical system in a star senor is very important. The spherical windows with a small impact to imaging performance are usually used in traditional star sensors. However, the spherical surfaces are not ideal aerodynamic surfaces and would cause problems such as high drag. In this paper the conformal window whose outer shape is neither spherical nor flat is used in a star sensor. Unfortunately, the conformal shape introduces amounts of aberration which may lead to low imaging resolution. The various correctors can be used to eliminate the aberrations, for example, the fixed corrector, the arch, Zernike wedges, and the deformable mirror. The fixed corrector method is selected to decrease aberrations from the conformal window in this paper. The surface of the conformal window in the star senor is described as the Von Karman equation. The field of view is 17.6°×13.5°, and the size of the CCD pixel is 6.45 um×6.45um. The optical design program ZEMAX is used to design this system. After the optimization, under the max frequency of 77.52lp/mm, the MFT can almost achieve 30%. The design results show that the aerodynamic requirements can be satisfied by the application of the conformal window in the star sensor, and the aberrations can be corrected by proper ways.

源语言英语
主期刊名International Symposium on Photoelectronic Detection and Imaging 2007
主期刊副标题Optoelectronic System Design, Manufacturing, and Testing
DOI
出版状态已出版 - 2008
已对外发布是
活动International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings - Beijing, 中国
期限: 9 9月 2007 → 12 9月 2007

丛书

姓名Proceedings of SPIE - The International Society for Optical Engineering
卷6624
ISSN(印刷版)0277-786X

会议

会议International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Optoelectronic System Design, Manufacturing, and Testings
国家/地区中国
市Beijing
时期9/09/07 → 12/09/07

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