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Anti-tarnishing evaluations of silver solid solution phase with indium

  • University of California at Irvine

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Pure silver or sterling silver can be tarnished under ordinary atmospheric conditions after a long period of time, or can be easily tarnished under severe environment with high concentration of hydrogen sulfide, sulfur gas, or sulfur dioxide. In electronic packaging, the epoxy molding compounds are gas permeable so that those corrosive gases could penetrate into plastic encapsulation. Therefore, silver-based interconnections will not be widely accepted if the issue of silver tarnishing cannot be addressed properly. In this paper, the authors present an alternative method to reduce the chemical reaction rate between silver and sulfur element containing gases by introducing silver solid solution phase with indium. A brief summary of preparation of the homogeneous silver solid solution phase with indium will be illustrated. The X-ray diffraction (XRD) patterns and scanning electron microscope/energy dispersive X-ray spectroscopy (SEM/EDX) results are shown in the paper to verify the chemical composition of silver solid solution phase with indium samples. In the following sections, both qualitative and quantitative experimental results of the chemical reactions between silver solid solution phase with indium samples and corrosive gases will be demonstrated and discussed with pure silver samples in comparison. According to experimental results of the anti-tarnishing evaluations, the reaction rate between silver and corrosive gases can be largely reduced without changing the appearance and color of the surface of silver samples. Finally, the impacts and implications of this research result to electronic packaging industry will be illuminated.

源语言英语
主期刊名2015 IEEE 65th Electronic Components and Technology Conference, ECTC 2015
出版商Institute of Electrical and Electronics Engineers Inc.
2180-2187
页数8
ISBN(电子版)9781479986095
DOI
出版状态已出版 - 15 7月 2015
已对外发布
活动2015 65th IEEE Electronic Components and Technology Conference, ECTC 2015 - San Diego, 美国
期限: 26 5月 201529 5月 2015

丛书

姓名Proceedings - Electronic Components and Technology Conference
2015-July
ISSN(印刷版)0569-5503

会议

会议2015 65th IEEE Electronic Components and Technology Conference, ECTC 2015
国家/地区美国
San Diego
时期26/05/1529/05/15

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