摘要
Building entire multiple-component devices on single nanowires is a promising strategy for miniaturizing electronic applications. Here we demonstrate a single nanowire capacitor with a coaxial asymmetric Cu-Cu 2 O-C structure, fabricated using a two-step chemical reaction and vapour deposition method. The capacitance measured from a single nanowire device corresponds to ∼140 μFcm2, exceeding previous reported values for metal-insulator-metal micro-capacitors and is more than one order of magnitude higher than what is predicted by classical electrostatics. Quantum mechanical calculations indicate that this unusually high capacitance may be attributed to a negative quantum capacitance of the dielectric-metal interface, enhanced significantly at the nanoscale.
| 源语言 | 英语 |
|---|---|
| 文章编号 | 879 |
| 期刊 | Nature Communications |
| 卷 | 3 |
| DOI | |
| 出版状态 | 已出版 - 2012 |
| 已对外发布 | 是 |
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