TY - GEN
T1 - An open-loop characteristic testing system of Coriolis mass flowmeter based on virtual instrument technology
AU - Chen, Kun
AU - Zheng, Dezhi
AU - Zhao, Jianhui
AU - Fan, Shangchun
PY - 2010
Y1 - 2010
N2 - Coriolis mass flowmeter (CMF) is becoming a research hotspot in flow measurement for its high accuracy and multi-parameter measurement. Through the dynamic study on CMF's vibrating model, get the conclusion that the key factors of close-loop system design is the open-loop characteristic parameters such as natural frequency and mechanical quality factor (Q value) et al. An open-loop testing system specialized for CMF is designed based on virtual instrument technology using Graphical Programming Language (LabVIEW). The algorithm adopts the rescanning sweep-frequency activating method. Experiment results show that the system has high frequency resolution, can analyze the open-loop characteristic of CMF rapidly and accurately, and also reduces the hardware cost to the full extent.
AB - Coriolis mass flowmeter (CMF) is becoming a research hotspot in flow measurement for its high accuracy and multi-parameter measurement. Through the dynamic study on CMF's vibrating model, get the conclusion that the key factors of close-loop system design is the open-loop characteristic parameters such as natural frequency and mechanical quality factor (Q value) et al. An open-loop testing system specialized for CMF is designed based on virtual instrument technology using Graphical Programming Language (LabVIEW). The algorithm adopts the rescanning sweep-frequency activating method. Experiment results show that the system has high frequency resolution, can analyze the open-loop characteristic of CMF rapidly and accurately, and also reduces the hardware cost to the full extent.
KW - CMF
KW - Mechanical quality factor
KW - Open-loop characteristic
KW - Rescanning sweep-frequency activate
KW - Virtual instrument technology
UR - https://www.scopus.com/pages/publications/77955219023
U2 - 10.1109/CCIE.2010.134
DO - 10.1109/CCIE.2010.134
M3 - Conference contribution
AN - SCOPUS:77955219023
SN - 9780769540269
T3 - 2010 International Conference on Computing, Control and Industrial Engineering, CCIE 2010
SP - 61
EP - 64
BT - 2010 International Conference on Computing, Control and Industrial Engineering, CCIE 2010
T2 - 1st International Conference on Computing Control and Industrial Engineering, CCIE 2010
Y2 - 5 June 2010 through 6 June 2010
ER -