@inproceedings{1590053f68754860935e4727e21ca695,
title = "An improved Integrated Coherent Receiver optical-electronic testing system",
abstract = "We present an improved 400G chip/device level Integrated Coherent Receiver (ICR) optical-electronic testing system based on the system last year [1]. It shows high repeatability and high accuracy compared with commercial system. This new system can greatly promote the efficiency, and it is also compatible for 100G/400G chip level test and device level test. What's more, the system can get most of important parameters of ICR automatically.",
keywords = "Chip level, Device level, Integrated Coherent Receiver, Mass production test, S parameter, phase error",
author = "Lei Xun and Peng Jiaxin and Liu Bolan and Zhu Shichao and Yu Sheng and Lululuzi and Cao Quan and Jiang Hao",
note = "Publisher Copyright: {\textcopyright} 2023 SPIE.; 2022 Applied Optics and Photonics China: Optoelectronics and Nanophotonics, AOPC 2022 ; Conference date: 18-12-2022 Through 19-12-2022",
year = "2023",
doi = "10.1117/12.2652043",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Buwen Cheng and Jin Guo and Sen Qian",
booktitle = "AOPC 2022",
address = "United States",
}