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Advanced simulation of rram memory cells

  • Toufik Sadi
  • , Oves Badami
  • , Vihar Georgiev
  • , Jie Ding
  • , Asen Asenov
  • Aalto University
  • University of Glasgow

科研成果: 书/报告/会议事项章节 › 会议稿件 › 同行评审

摘要

Resistive random-access memories (RRAMs) are overwhelmingly viewed as potential candidates for the next generation of non-volatile memory devices. Here, we discuss the advantages of the kinetic Monte Carlo (KMC) simulation framework for RRAMs. We use a robust KMC simulator to analyze transport in promising oxide structures. The simulator couples self-consistently charge transport and thermal effects in the three-dimensional (3D) space, allowing a realistic reconstruction of the conductive filaments responsible for switching. By presenting insightful results, we argue that using a 3D physical electro-thermal simulator is necessary for understanding RRAM operation and reliability.

源语言英语
主期刊名Proceedings - 2019 IEEE 13th International Conference on ASIC, ASICON 2019
编辑Fan Ye, Ting-Ao Tang
出版商IEEE Computer Society
ISBN(电子版)9781728107356
DOI
出版状态已出版 - 10月 2019
已对外发布是
活动13th IEEE International Conference on ASIC, ASICON 2019 - Chongqing, 中国
期限: 29 10月 2019 → 1 11月 2019

丛书

姓名Proceedings of International Conference on ASIC
ISSN(印刷版)2162-7541
ISSN(电子版)2162-755X

会议

会议13th IEEE International Conference on ASIC, ASICON 2019
国家/地区中国
市Chongqing
时期29/10/19 → 1/11/19

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