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A synthetic method for wafer character recognition

  • Beijing Institute of Technology
  • Shanghai Maritime University
  • University of Canberra

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A synthetic method for wafer character recognition is discussed in this paper. The pre-processing of image, stroke detection and segmentation specially to wafer image are discussed. The special structure matching method is proposed. Finally, combined SOM tree classifier with structure matching method, a synthetic method is proposed which is superior to any single one.

源语言英语
主期刊名IMECS 2007 - International MultiConference of Engineers and Computer Scientists 2007
1936-1938
页数3
出版状态已出版 - 2007
活动International MultiConference of Engineers and Computer Scientists 2007, IMECS 2007 - Kowloon, 香港
期限: 21 3月 200723 3月 2007

出版系列

姓名Lecture Notes in Engineering and Computer Science
2
ISSN(印刷版)2078-0958

会议

会议International MultiConference of Engineers and Computer Scientists 2007, IMECS 2007
国家/地区香港
Kowloon
时期21/03/0723/03/07

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