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A simply equipped fourier ptychography platform based on an industrial camera and telecentric objective

  • School of Optics and Photonics
  • Beijing Institute of Technology

科研成果: 期刊稿件 › 文章 › 同行评审

摘要

Fourier ptychography microscopy (FPM) is a recently emerged computational imaging method, which combines the advantages of synthetic aperture and phase retrieval to achieve super-resolution microscopic imaging. FPM can bypass the diffraction limit of the numerical aperture (NA) system and achieve complex images with wide field of view and high resolution (HR) on the basis of the existing microscopic platform, which has low resolution and wide field of view. Conventional FPM platforms are constructed based on basic microscopic platform and a scientific complementary metal–oxide–semiconductor (sCMOS) camera, which has ultrahigh dynamic range. However, sCMOS, or even the microscopic platform, is too expensive to afford for some researchers. Furthermore, the fixed microscopic platform limits the space for function expansion and system modification. In this work, we present a simply equipped FPM platform based on an industrial camera and telecentric objective, which is much cheaper than sCMOS camera and microscopic platform and has accurate optical calibration. A corresponding algorithm was embedded into a conventional FP framework to overcome the low dynamic range of industrial cameras. Simulation and experimental results showed the feasibility and good performance of the designed FPM platform and algorithms.

源语言英语
期刊论文编号4913
期刊Sensors (Switzerland)
卷19
期22
DOI
出版状态已出版 - 2 11月 2019

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