跳到主要导航 跳到搜索 跳到主要内容

A Siamese Network Utilizing Image Structural Differences for Cross-Category Defect Detection

  • Chenhui Luan
  • , Ruyao Cui
  • , Lei Sun
  • , Zhiping Lin

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A machine learning based defect detection system generally requires a new training procedure upon a new product category. In industry applications where there are variant product categories, a re-training upon category changing could be time expensive and unacceptable. In this work, a two-layer neural networks are proposed for cross-category defect detection without re-training. Different from traditional neural networks, the proposed method learns differences from image-pairs containing certain structural similarity rather than from a single image. With the assumption that different categorical objects could share certain structural similarity indicated by these learned image pairwise differences, a pairwise Siamese neural network is used in the proposed neural networks for defect detection. The cross-category capability of the proposed method is evidenced via experiments based on real-world factory datasets.

源语言英语
主期刊名2020 IEEE International Conference on Image Processing, ICIP 2020 - Proceedings
出版商IEEE Computer Society
778-782
页数5
ISBN(电子版)9781728163956
DOI
出版状态已出版 - 10月 2020
活动2020 IEEE International Conference on Image Processing, ICIP 2020 - Virtual, Abu Dhabi, 阿拉伯联合酋长国
期限: 25 9月 202028 9月 2020

出版系列

姓名Proceedings - International Conference on Image Processing, ICIP
2020-October
ISSN(印刷版)1522-4880

会议

会议2020 IEEE International Conference on Image Processing, ICIP 2020
国家/地区阿拉伯联合酋长国
Virtual, Abu Dhabi
时期25/09/2028/09/20

指纹

探究 'A Siamese Network Utilizing Image Structural Differences for Cross-Category Defect Detection' 的科研主题。它们共同构成独一无二的指纹。

引用此