@inproceedings{e18f784f8fee473cad9522b90d929fb6,
title = "A Siamese Network Utilizing Image Structural Differences for Cross-Category Defect Detection",
abstract = "A machine learning based defect detection system generally requires a new training procedure upon a new product category. In industry applications where there are variant product categories, a re-training upon category changing could be time expensive and unacceptable. In this work, a two-layer neural networks are proposed for cross-category defect detection without re-training. Different from traditional neural networks, the proposed method learns differences from image-pairs containing certain structural similarity rather than from a single image. With the assumption that different categorical objects could share certain structural similarity indicated by these learned image pairwise differences, a pairwise Siamese neural network is used in the proposed neural networks for defect detection. The cross-category capability of the proposed method is evidenced via experiments based on real-world factory datasets.",
keywords = "Siamese neural network, computer vision, defect detection",
author = "Chenhui Luan and Ruyao Cui and Lei Sun and Zhiping Lin",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 2020 IEEE International Conference on Image Processing, ICIP 2020 ; Conference date: 25-09-2020 Through 28-09-2020",
year = "2020",
month = oct,
doi = "10.1109/ICIP40778.2020.9191128",
language = "English",
series = "Proceedings - International Conference on Image Processing, ICIP",
publisher = "IEEE Computer Society",
pages = "778--782",
booktitle = "2020 IEEE International Conference on Image Processing, ICIP 2020 - Proceedings",
address = "United States",
}