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A new scene-based nonuniformity corrrection applied in boundary backward recursive reconstruction for arbitrary subpixel microscan

  • Yi Nan Chen*
  • , Wei Qi Jin
  • , Lei Zhao
  • , Lin Zhao
  • , Tan Wang
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • Stevens Institute of Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

A scene-based nonuiformity correction occurred in the operation of recursive reconstruction for high resolution extracted from subpixel microscan imaging (SMI) sequence are presented and analyzed. The reconstruction algorithm in terms of block-by-block method recursive from the prescient boundary to centre in uniform 2×2 SMI, is updated to the two-dimensional focus plane array (FPA) considering the arbitrary scan translation not equivalent to the accurate halfpixel. In this paper, the focus is concentrated to the nonuniform SMI model with fixed pattern noise (FPN), which corrupts the image by the gain and offset from the individual cell-detector. Then, we firstly demonstrate that once our backward recursive reconstruction implements to the undersampled sequence with FPN, the dramatic impact to the majority pixels is the elimination of the offset due to the quits efficiency by inverse iterative function in each 2×2 region belonging to the high resolution lattice. The final achievement is the nonuiformity correction (NUC) synchronously concomitant with the higher resolution, so our method fully takes account of the potential information of the scanned inter-frames. Application of proposed algorithm to the simulated SMI procedure has the obvious superiority, including the much better image quality indexes from the cleaned FPN, time-consumed saving within one scan period (4 frames), no requirements of statistical assumption so as to the avoidance of ghost artifact, and the inter-frames adaptive property.

源语言英语
主期刊名International Symposium on Photoelectronic Detection and Imaging 2007
主期刊副标题Photoelectronic Imaging and Detection
DOI
出版状态已出版 - 2008
活动International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Photoelectronic Imaging and Detection - Beijing, 中国
期限: 9 9月 200712 9月 2007

丛书

姓名Proceedings of SPIE - The International Society for Optical Engineering
6621
ISSN(印刷版)0277-786X

会议

会议International Symposium on Photoelectronic Detection and Imaging, ISPDI 2007: Photoelectronic Imaging and Detection
国家/地区中国
Beijing
时期9/09/0712/09/07

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