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A Method for Small-Sample Data Augmentation of Weld Seam Radiographs Based on Deep Convolutional Generative Adversarial Networks

  • Wenpin Zhang*
  • , Wangwang Liu
  • , Dugang Kang
  • , Yan Li
  • , Zhi Xiong
  • , Xinghua Yu
  • , Junfu Lu
  • , Lin Ma
  • , Xiaorong Luo
  • , Yanyun Huang
  • *此作品的通讯作者
  • Chongqing Special Equipment Inspection and Research Institute
  • Chongqing Technology Innovation Center of New Material Production Equipment Safety
  • Chongqing University
  • Beijing Institute of Technology

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Addressing the core issues of scarce small defect samples (cracks) in weld radiographic images, insufficient fidelity of defect details in existing generation methods, and the tendency to lose fine-grained features in full-image generation, this paper proposes an improved DCGAN-based data enhancement method for weld radiographic images, combining local generation with background fusion. This method constructs pre- and post-processing algorithms adapted to the characteristics of industrial radiographic films, reducing the learning difficulty of the network through local cropping and contrast normalization; optimizes the DCGAN fully convolutional network architecture, combining gray-level distribution constraints and defect feature fidelity constraints to achieve high-fidelity generation of local crack samples; and generates complete weld images conforming to DS-level industrial standards through background fusion and inverse gray-level normalization. Comparative and ablation experiments were conducted based on a weld crack dataset conforming to GB/T 3323-2019 standard. Quantitative verification of the enhancement effect was completed using YOLOv8 as the baseline model. Results show that the FID value of the samples generated by this method is as low as 12.36, and the SSIM value reaches 0.947. It can improve the detection model mAP@0.5 to 96.32%, an improvement of 21.47 percentage points compared to the original small-sample scheme. It possesses excellent adaptability to industrial scenarios and can provide reliable technical support for intelligent detection of small-sample defects in the field of industrial radiographic testing.

源语言英语
主期刊名2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
出版商Institute of Electrical and Electronics Engineers Inc.
1007-1012
页数6
ISBN(电子版)9798331559076
DOI
出版状态已出版 - 2026
活动2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026 - Changchun, 中国
期限: 29 5月 202631 5月 2026

丛书

姓名2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026

会议

会议2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
国家/地区中国
Changchun
时期29/05/2631/05/26

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