TY - GEN
T1 - A Method for Small-Sample Data Augmentation of Weld Seam Radiographs Based on Deep Convolutional Generative Adversarial Networks
AU - Zhang, Wenpin
AU - Liu, Wangwang
AU - Kang, Dugang
AU - Li, Yan
AU - Xiong, Zhi
AU - Yu, Xinghua
AU - Lu, Junfu
AU - Ma, Lin
AU - Luo, Xiaorong
AU - Huang, Yanyun
N1 - Publisher Copyright:
© 2026 IEEE.
PY - 2026
Y1 - 2026
N2 - Addressing the core issues of scarce small defect samples (cracks) in weld radiographic images, insufficient fidelity of defect details in existing generation methods, and the tendency to lose fine-grained features in full-image generation, this paper proposes an improved DCGAN-based data enhancement method for weld radiographic images, combining local generation with background fusion. This method constructs pre- and post-processing algorithms adapted to the characteristics of industrial radiographic films, reducing the learning difficulty of the network through local cropping and contrast normalization; optimizes the DCGAN fully convolutional network architecture, combining gray-level distribution constraints and defect feature fidelity constraints to achieve high-fidelity generation of local crack samples; and generates complete weld images conforming to DS-level industrial standards through background fusion and inverse gray-level normalization. Comparative and ablation experiments were conducted based on a weld crack dataset conforming to GB/T 3323-2019 standard. Quantitative verification of the enhancement effect was completed using YOLOv8 as the baseline model. Results show that the FID value of the samples generated by this method is as low as 12.36, and the SSIM value reaches 0.947. It can improve the detection model mAP@0.5 to 96.32%, an improvement of 21.47 percentage points compared to the original small-sample scheme. It possesses excellent adaptability to industrial scenarios and can provide reliable technical support for intelligent detection of small-sample defects in the field of industrial radiographic testing.
AB - Addressing the core issues of scarce small defect samples (cracks) in weld radiographic images, insufficient fidelity of defect details in existing generation methods, and the tendency to lose fine-grained features in full-image generation, this paper proposes an improved DCGAN-based data enhancement method for weld radiographic images, combining local generation with background fusion. This method constructs pre- and post-processing algorithms adapted to the characteristics of industrial radiographic films, reducing the learning difficulty of the network through local cropping and contrast normalization; optimizes the DCGAN fully convolutional network architecture, combining gray-level distribution constraints and defect feature fidelity constraints to achieve high-fidelity generation of local crack samples; and generates complete weld images conforming to DS-level industrial standards through background fusion and inverse gray-level normalization. Comparative and ablation experiments were conducted based on a weld crack dataset conforming to GB/T 3323-2019 standard. Quantitative verification of the enhancement effect was completed using YOLOv8 as the baseline model. Results show that the FID value of the samples generated by this method is as low as 12.36, and the SSIM value reaches 0.947. It can improve the detection model mAP@0.5 to 96.32%, an improvement of 21.47 percentage points compared to the original small-sample scheme. It possesses excellent adaptability to industrial scenarios and can provide reliable technical support for intelligent detection of small-sample defects in the field of industrial radiographic testing.
KW - Weld radiographic testing
KW - YOLOv8
KW - crack defects
KW - improved DCGAN
KW - nondestructive testing
KW - small-sample data enhancement
UR - https://www.scopus.com/pages/publications/105046520794
U2 - 10.1109/ICETCI68937.2026.11610849
DO - 10.1109/ICETCI68937.2026.11610849
M3 - Conference contribution
AN - SCOPUS:105046520794
T3 - 2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
SP - 1007
EP - 1012
BT - 2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2026 IEEE 6th International Conference on Electronic Technology, Communication and Information, ICETCI 2026
Y2 - 29 May 2026 through 31 May 2026
ER -