A high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI

Yi Jiang; Caijie Tang

doi:10.1088/0957-0233/19/6/065304

A high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI

Yi Jiang^*
, Caijie Tang

^*此作品的通讯作者

光电学院

Beijing Institute of Technology

科研成果: 期刊稿件 › 文章 › 同行评审

14 引用（Scopus）

摘要

A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10^-3 νε is achieved.

源语言	英语
文章编号	065304
期刊	Measurement Science and Technology
卷	19
期	6
DOI	https://doi.org/10.1088/0957-0233/19/6/065304
出版状态	已出版 - 1 6月 2008

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abstract = "A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10-3 νε is achieved.",

keywords = "Extrinsic Fabry-Perot interferometer, Fiber-optical sensors, Fourier transform, White-light interferometry",

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AU - Jiang, Yi

AU - Tang, Caijie

PY - 2008/6/1

Y1 - 2008/6/1

N2 - A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10-3 νε is achieved.

AB - A white-light interferometry-based high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI is demonstrated. The phase difference between the two white-light optical spectra is calculated by a Fourier- transform-based technique. From this phase difference, the difference in cavity length between the two EFPIs is calculated. This, in turn, is used to measure strain. A strain resolution of 8.27 × 10-3 νε is achieved.

KW - Extrinsic Fabry-Perot interferometer

KW - Fiber-optical sensors

KW - Fourier transform

KW - White-light interferometry

UR - https://www.scopus.com/pages/publications/46749132343

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DO - 10.1088/0957-0233/19/6/065304

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SN - 0957-0233

VL - 19

JO - Measurement Science and Technology

JF - Measurement Science and Technology

IS - 6

M1 - 065304

ER -

A high-resolution technique for strain measurement using an extrinsic Fabry-Perot interferometer (EFPI) and a compensating EFPI

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