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A Formal Verification Approach for Measures of Effectiveness Based on Satisfiability Modulo Theories

  • Yongji Yuan
  • , Guoxin Wang*
  • , Yihui Gong
  • , Jinzhi Lu
  • , Shouxuan Wu*
  • , Mengru Dong
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • Beihang University

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Model-Based Systems Engineering (MBSE) provides a formal and integrated framework for managing multidisciplinary information throughout the system design lifecycle. Within this framework, Measures of Effectiveness (MOEs) serve as the key quantitative metrics for evaluating whether a system design meets mission requirements. Current approaches for verifying MOE constraints in MBSE typically rely on mathematical relationships established through SysML parametric diagrams, with metrics analysis performed using built-in computational plug-ins or external specialized software. However, these approaches face challenges in unified representation of multitheory hybrid constraints, automated exploration for feasible solutions, and tool-level data consistency. This limits the reliability and completeness of verification results. This paper proposes a formal verification approach for MOE by integrating the multi-architecture modeling language KARMA with Satisfiability Modulo Theories (SMT). The approach provides a unified firstorder logic (FOL) representation of MOE-related metrics. It also automates the evaluation of SysML parametric diagrams through SMT solver, enabling constraint satisfiability checking and reverse derivation of optimal design solutions. A satellite electric power system (EPS) case study demonstrates the feasibility and effectiveness of the proposed approach. The results show that the approach ensures the consistency between system metrics and requirements, and improves automation and completeness of MOE verification within the MBSE framework.

源语言英语
主期刊名SysCon 2026 - The 20th Annual IEEE International Systems Conference, Conference Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798331591519
DOI
出版状态已出版 - 2026
已对外发布
活动20th Annual IEEE International Systems Conference, SysCon 2026 - Halifax, 加拿大
期限: 6 4月 20269 4月 2026

出版系列

姓名SysCon 2026 - The 20th Annual IEEE International Systems Conference, Conference Proceedings

会议

会议20th Annual IEEE International Systems Conference, SysCon 2026
国家/地区加拿大
Halifax
时期6/04/269/04/26

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