摘要
This work presents a compact second-order noise shaping successive approximation register (NS-SAR) analog-to-digital converter (ADC) featuring a novel kT/C noise shaping technique. The proposed kT/C noise shaping technique selectively suppresses kT/C noise within the signal bandwidth of an oversampled SAR ADC. It avoids using a wideband noise extraction amplifier as in the conventional kT/C noise-canceling method. Thus, it achieves a greatly reduced input sampling capacitance, high power efficiency, and low input noise penalty. A prototype ADC implemented in a 28-nm process achieves 85.8 dB signal-to-noise-and-distortion ratio (SNDR) across a 1.25 MHz bandwidth with sampling capacitors of only 150 fF and off-chip mismatch calibration. The power consumption at 40 MS/s is 0.9 mW, resulting in a Schreier figure of merit (FoMS) of 177.2 dB. The ADC occupies an area of 0.0035-mm2, which is the smallest among all published ADCs with over 70 dB SNDR with calibration.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 2798-2808 |
| 页数 | 11 |
| 期刊 | IEEE Journal of Solid-State Circuits |
| 卷 | 61 |
| 期 | 6 |
| DOI | |
| 出版状态 | 已出版 - 1 6月 2026 |
| 已对外发布 | 是 |
指纹
探究 'A 0.0035-mm2 86-dB-SNR 1.25-MHz-BW Noise-Shaping SAR ADC Enabling kT/C Noise Shaping' 的科研主题。它们共同构成独一无二的指纹。引用此
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