TY - GEN
T1 - 3D virtual and real synchronous mapping modeling and operation control technology oriented to automatic test unit
AU - Lin, Zhibin
AU - Wang, Aiming
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/6/20
Y1 - 2018/6/20
N2 - Automatic test system will generate a large number of data in the test process, how to monitor the test system more intuitively is an urgent problem. In this paper, a 3D virtual and real synchronous mapping modeling and operation control technology for automatic test unit is proposed, it includes a view based 3D scene switching control technology and the scene control instruction mapping technology driven by the actual execution state. Through these two technical means, the real-time control and control of the fine management of the automatic test line and the visualization of the test execution process are realized. Finally, a production management system is designed and verifies the effectiveness of the above technologies successfully.
AB - Automatic test system will generate a large number of data in the test process, how to monitor the test system more intuitively is an urgent problem. In this paper, a 3D virtual and real synchronous mapping modeling and operation control technology for automatic test unit is proposed, it includes a view based 3D scene switching control technology and the scene control instruction mapping technology driven by the actual execution state. Through these two technical means, the real-time control and control of the fine management of the automatic test line and the visualization of the test execution process are realized. Finally, a production management system is designed and verifies the effectiveness of the above technologies successfully.
KW - ATS
KW - operation control
KW - virtual and real synchronization mapping
KW - visual management and control
UR - https://www.scopus.com/pages/publications/85050038331
U2 - 10.1109/ICEEE2.2018.8391364
DO - 10.1109/ICEEE2.2018.8391364
M3 - Conference contribution
AN - SCOPUS:85050038331
T3 - 2018 5th International Conference on Electrical and Electronics Engineering, ICEEE 2018
SP - 371
EP - 374
BT - 2018 5th International Conference on Electrical and Electronics Engineering, ICEEE 2018
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 5th International Conference on Electrical and Electronics Engineering, ICEEE 2018
Y2 - 3 May 2018 through 5 May 2018
ER -