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混合介质层类同轴硅通孔等效电路模型的建立与验证

  • Han Wang
  • , Ziru Cai
  • , Zhaohu Wu
  • , Zeda Wang
  • , Yingtao Ding*
  • *此作品的通讯作者
  • Beijing Institute of Technology
  • Ltd.

科研成果: 期刊稿件文章同行评审

摘要

Coaxially-shielded through-silicon-via with mixed dielectric layer (MD CSTSV) has showed great application prospect in the field of high density RF packaging due to its excellent electrical properties, simple fabrication process and low cost. In this paper, an equivalent circuit model of MD CSTSV was established based on the theory of multi-conductor transmission line and the calculation formulas for complex capacitance of annular dielectric layer with introduced scale factor λ, obtaining RLGC electrical parameters of the structure per unit length. The results show that in the frequency range of 0.1~40 GHz, the S-parameter results calculated through the equivalent circuit model of MD CSTSV are consistent well with those obtained from HFSS full wave simulation, presenting less than 7% maximum error. All the results show that the extracted per unit length RLGC electrical parameters of MD CSTSV and the corresponding equivalent circuit model can be used to accurately simulate the signal transmission performance of MD CSTSV.

投稿的翻译标题Establishment and Verification of Equivalent Circuit Model for Coaxially-Shielded TSV with Mixed Dielectric Layer
源语言繁体中文
页(从-至)640-648
页数9
期刊Beijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
43
6
DOI
出版状态已出版 - 6月 2023

关键词

  • coaxially shielded
  • mixed dielectric layer
  • theory of transmission line
  • through-silicon-via(TSV)

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