基于GO 法的单输出爆炸逻辑网络系统可靠性分析

In order to effectively improve the reliability level of the explosive logic circuit system and identify the weakness of the system, the reliability analysis method of the explosive logic circuit system was established based on the GO theory(goal oriented methodology). According to the working principle of the single output explosive logic circuit system, the GO model was established, and the state combination method was used for quantitative calculation and qualitative analysis. Results show that the reliability of the single output explosive logic circuit system is 0.977, while the minimum cut set is the detonator I₁, detonator I₂, detonator I₃, null gate N₁ and null gate N₃. The reliability block diagram of the single-output explosive logic circuit system was also established, and the system reliability was calculated. The result is consistent with the GO state combination method, which verifies the feasibility of the GO method applied to the reliability analysis of single-output explosive logic circuit system.