TY - JOUR
T1 - Zonal wavefront reconstruction with multidirectional difference wavefronts for multilateral shearing interferometers
AU - Zhong, Hui
AU - Li, Yanqiu
AU - Liu, Ke
AU - Han, Xiting
AU - Wang, Tao
AU - Zhao, Zhe
N1 - Publisher Copyright:
© 2025 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.
PY - 2025/6/20
Y1 - 2025/6/20
N2 - Wavefront reconstruction is a key step in multilateral shearing interferometers, directly influencing measurement accuracy. Conventional zonal reconstruction methods typically use only two orthogonal difference wavefronts, which limits measurement accuracy. In this paper, we innovatively propose a zonal wavefront reconstruction method that utilizes multidirectional difference wavefronts, comprehensively considering all difference wavefront information in the interferogram. By incorporating two diagonal difference wavefronts into the wavefront expression at specific grid points, we construct a multidirectional reconstruction equation that includes vertical, horizontal, diagonal, and anti-diagonal directions. This method provides a more accurate description of subtle wavefront variations, improving measurement precision and noise immunity. Simulation tests demonstrate that this approach achieves high reconstruction accuracy across a broader range of shear ratios and exhibits better noise immunity than the traditional zonal method. Furthermore, experimental platforms for the null test and the dynamic response test using quadriwave lateral shearing interferometry are established. Experimental results indicate that, compared to the traditional zonal reconstruction method, the proposed method enhances the absolute measurement precision of quadriwave lateral shearing interferometry from 0.0065λ to 0.0048λ RMSE (λ = 635 nm). The method exhibits superior linear response and higher detection accuracy in aberration measurement, fully confirming its practicability and effectiveness. This research has significant application value and research implications in the field of surface detection and aberration analysis of optical systems.
AB - Wavefront reconstruction is a key step in multilateral shearing interferometers, directly influencing measurement accuracy. Conventional zonal reconstruction methods typically use only two orthogonal difference wavefronts, which limits measurement accuracy. In this paper, we innovatively propose a zonal wavefront reconstruction method that utilizes multidirectional difference wavefronts, comprehensively considering all difference wavefront information in the interferogram. By incorporating two diagonal difference wavefronts into the wavefront expression at specific grid points, we construct a multidirectional reconstruction equation that includes vertical, horizontal, diagonal, and anti-diagonal directions. This method provides a more accurate description of subtle wavefront variations, improving measurement precision and noise immunity. Simulation tests demonstrate that this approach achieves high reconstruction accuracy across a broader range of shear ratios and exhibits better noise immunity than the traditional zonal method. Furthermore, experimental platforms for the null test and the dynamic response test using quadriwave lateral shearing interferometry are established. Experimental results indicate that, compared to the traditional zonal reconstruction method, the proposed method enhances the absolute measurement precision of quadriwave lateral shearing interferometry from 0.0065λ to 0.0048λ RMSE (λ = 635 nm). The method exhibits superior linear response and higher detection accuracy in aberration measurement, fully confirming its practicability and effectiveness. This research has significant application value and research implications in the field of surface detection and aberration analysis of optical systems.
UR - http://www.scopus.com/inward/record.url?scp=105008328054&partnerID=8YFLogxK
U2 - 10.1364/AO.557606
DO - 10.1364/AO.557606
M3 - Article
AN - SCOPUS:105008328054
SN - 1559-128X
VL - 64
SP - 5149
EP - 5157
JO - Applied Optics
JF - Applied Optics
IS - 18
ER -