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Zero-shot Fault Diagnosis under Incomplete Information

  • Nuo Cheng
  • , Zuodan He
  • , Naixin Chen
  • , Chunli Zhu*
  • *Corresponding author for this work
  • Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

With the rapid development of industry, fault diagnosis has become the key to ensure the reliability and efficiency of industrial systems. In this work, we proposed a zero-shot fault diagnosis method under incomplete information. Firstly, based on Jensen-Shannon Divergence (JSD) calculation, this method constructs a classifier to divide the test samples into detected known classes and detected unknown classes. Then, the detected unknown classes are clustered by using the K-means algorithm. Also, to alleviate the impact of domain bias in zero-shot fault diagnosis, the classifier is used again to classify the detected known classes into sub-known classes and sub-unknown classes. Afterwards, fault features are extracted via a feature extractor, and they are calculated with the set semantic vectors. According to the calculation results, the sub-known classes and sub-unknown classes are classified. In order to simulate the situation where the fault samples have incomplete information due to missing data, the missing rate is set 10%, 30%, and 50% sequentially. By optimizing the feature extraction network structure, the prediction accuracy increased 10.53% at the missing rate of 30% on the Case Western Reserve University (CWRU) bearing dataset. On the American-Society for Mechanical Failure Prevention Technology (MFPT) dataset, the prediction accuracy increased 10.98% at the missing rate of 50%. These results show an improvement for zero sample fault diagnosis under incomplete information.

Original languageEnglish
Title of host publicationProceedings of 2025 IEEE International Conference on Unmanned Systems, ICUS 2025
EditorsRong Song
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages720-725
Number of pages6
ISBN (Electronic)9798331526726
DOIs
Publication statusPublished - 2025
Externally publishedYes
Event2025 IEEE International Conference on Unmanned Systems, ICUS 2025 - Changzhou, China
Duration: 18 Sept 202519 Sept 2025

Publication series

NameProceedings of 2025 IEEE International Conference on Unmanned Systems, ICUS 2025

Conference

Conference2025 IEEE International Conference on Unmanned Systems, ICUS 2025
Country/TerritoryChina
CityChangzhou
Period18/09/2519/09/25

Keywords

  • fault diagnosis
  • incomplete information
  • unsupervised learning
  • zero-shot learning

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