TY - JOUR
T1 - Yellow electroluminescence realized in GaN/Si nanoheterostructures based on silicon nanoporous pillar array
AU - Ji, Huifang
AU - Liu, Weikang
AU - Li, Ying
AU - Li, Sen
AU - Lei, Lingzhi
AU - Shi, Zhifeng
AU - Li, Xinjian
N1 - Publisher Copyright:
© 2018 Elsevier B.V.
PY - 2018/7
Y1 - 2018/7
N2 - GaN/Si nanoheterostructures were prepared at different growth temperatures by using chemical vapor deposition method with Si nanoporous pillar array (Si-NPA) as the substrate. We detailedly investigated the optical, structural, and electrical characteristics of the resulting GaN/Si-NPA nanoheterostructures. The photoluminescence spectra of the nanoheterostructures include three emission components, and their corresponding emission mechanisms were discussed. Further, a heterojunction device was fabricated, which showed an obvious rectifying behavior, compatible with the thermionic emission and space-charge-limited current models at low/high forward biases. More importantly, a strong yellow emission at ~ 560 nm was achieved under forward bias, which can be assigned to the defect-related transition emission in GaN. The results obtained may provide important guidelines for understanding the basic physics of GaN/Si-NPA nanoheterostructures, facilitating their potential applications in light-emitting diodes.
AB - GaN/Si nanoheterostructures were prepared at different growth temperatures by using chemical vapor deposition method with Si nanoporous pillar array (Si-NPA) as the substrate. We detailedly investigated the optical, structural, and electrical characteristics of the resulting GaN/Si-NPA nanoheterostructures. The photoluminescence spectra of the nanoheterostructures include three emission components, and their corresponding emission mechanisms were discussed. Further, a heterojunction device was fabricated, which showed an obvious rectifying behavior, compatible with the thermionic emission and space-charge-limited current models at low/high forward biases. More importantly, a strong yellow emission at ~ 560 nm was achieved under forward bias, which can be assigned to the defect-related transition emission in GaN. The results obtained may provide important guidelines for understanding the basic physics of GaN/Si-NPA nanoheterostructures, facilitating their potential applications in light-emitting diodes.
UR - https://www.scopus.com/pages/publications/85044162195
U2 - 10.1016/j.jlumin.2018.03.049
DO - 10.1016/j.jlumin.2018.03.049
M3 - Article
AN - SCOPUS:85044162195
SN - 0022-2313
VL - 199
SP - 194
EP - 199
JO - Journal of Luminescence
JF - Journal of Luminescence
ER -